 ISSN 0235-7216 ISSN 2424-4538 (online) |
2009 m. Nr. 1 X-ray photoelectron spectroscopy investigation of CuxS and TlxS layers on the polyamide film surface formed with the use of dodecathionic acid
The phase composition of polyamide 6 (PA) films modified by layers of copper sulfides, CuxS, and thallium sulfides, TlxS, was studied by the x-ray photoelectron spectroscopy method. Copper sulfide and thallium sulfide layers on the surface of PA film were formed by treating PA film samples in a 0.002 mol · dm–3 solution of dodecathionic acid, H2S12O6, at a temperature of 20 and 40 °C and then with Cu(II / I) salts or Tl2SO4 solution. It was determined that in the surface of PA samples modified by copper sulfides, various copper, sulfur and oxygen compounds (CuS, Cu2S, CuO, S8, CuSO4 and Cu(OH)2) and in the PA surface modified by thallium sulfides, various thallium, sulfur and oxygen compounds (Tl2O3, Tl2S3, Tl2S, S8, Tl2SO4 and Tl(OH)3) were present. The content of copper and thallium sulfides in deeper chalcogenide layers was higher than on the surface of the layers. Keywords: CuxS and TlxS layers, polyamide, X-ray photoelectron spectroscopy |
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