Chemija / Chemistry
 ISSN 0235-7216 ISSN 2424-4538 (online) |
2014 m. Nr. 1 YSZ plonų sluoksnių ant korundo, silicio ir silicio oksido padėklų UV-Vis spektroskopiniai tyrimai
The preparation and characterization of the ZrO2 stabilized with Y2O3 (YSZ) thin films on different substrates, which were produced by the so-called aqueous sol-gel synthesis, are reported. This sol-gel method is based on the complexation of the metal nitrate salts with 1,2-propanediol producing a final compound as thin layers on Al2O3, Si and SiO2 substrates at relatively low temperatures compared with solid state reaction. Moreover, in this study we compared the optical properties of obtained films prepared by sol-gel synthesis using the dip-coating technique. All as-prepared YSZ thin layers on different substrates were dried at 400 °C temperature on a hot-plate and afterwards repeatedly calcined at 800 °C for 1 hour in air atmosphere after each coating procedure and characterized by X-ray diffraction (XRD) analysis, scanning electron microscopy (SEM) and UV-Vis spectroscopy. XRD data exhibited that at 800 °C temperature a single crystalline Y0.2Zr0.8O2 thin film with a cubic (Fm-3m) crystal structure was formed. The morphological features of the obtained coating investigated by SEM confirmed the nanosized surface of the YSZ coating. The optical reflection (UV-Vis) measurements of sol-gel derived specimens let us to conclude that both the preparation technique of the synthesized thin films and the amount of coating procedures significantly influence the optical properties of the as-prepared YSZ surfaces.
Keywords: inorganic compounds, thin films, sol-gel growth, microstructure, optical properties |
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